Sub-Micron Computerized Bench Micrometer – Wireless
A computerized bench micrometer measures external diameters with the workpiece held against a fixed anvil and spindle, removing the hand-alignment variation inherent to hand-held micrometers. This sub-micron model is built specifically for measurement tasks where resolution is the deciding factor.
Key Features
This model is positioned around fine resolution — suited to measurement tasks where the part tolerance is tight enough that fine discrimination between very close diameters matters more than covering a wide range of part sizes at one station. Exact resolution figures, accuracy class, and wireless protocol for this specific model are needs verification against the manufacturer datasheet — “sub-micron” in the product name itself indicates resolution finer than a standard bench micrometer.
Choosing the Right Bench Micrometer
BTSA offers this instrument alongside two related bench micrometer models built around different priorities: the Wide Range Computerized Bench Micrometer – Wireless (optimized for broad diameter coverage) and the Universal Computerized Bench Micrometer – Wireless (optimized for flexible fixturing). Choose this Sub-Micron model when fine resolution is the priority for your part tolerance.
Applications
Bench micrometers are typically used in inspection labs and dedicated QA stations for verifying shaft, pin, and roller diameters in high-volume precision manufacturing. See BTSA’s Mitutoyo Micrometer range for related instruments, and BTSA’s calibration services for NABL-traceable calibration of bench micrometers.
Frequently Asked Questions
What does “sub-micron” mean for this bench micrometer?
It indicates the instrument is built for finer resolution than a standard bench micrometer — suited to measurement tasks where fine discrimination between very close diameters matters most. Exact resolution figure: needs verification.
When should I choose the Sub-Micron model instead of the Wide Range model?
Choose this model when resolution/fineness of discrimination is the priority for your part tolerance. If your priority is instead covering many different diameter families at one station, see the Wide Range Computerized Bench Micrometer – Wireless.
Does this model also support wireless SPC data output?
Yes — like the other computerized bench micrometers in this range, it is designed to transmit readings wirelessly, reducing manual data-entry error. Specific protocol/software compatibility: needs verification.
How does this differ from the Universal model?
The Universal Computerized Bench Micrometer – Wireless is built around flexible or interchangeable fixturing for varied part geometries, rather than being optimized specifically for fine resolution.
